ITES China Shenzhen International Industrial Manufacturing Technology and Equipment Exhibition
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2026.3.31-4.3 Shenzhen World Exhibition & Convention Center
Company Introduce
Shenzhen Beijia Technology Co., Ltd. has been dedicated to research and development of optical inspection&measurement solutions for microelectronics industries over 25 years. We has won the National High&New Technology Enterprise certification,ISO9001 certification,etc.. Our teams are composed of sales and technical experts who have profound knowledge and experience in both our products and our customers' products.Thus we're have gain trust from leading microelectronics companies in China from areas of semiconductor, lithium-ion new energy, LCD panel, optical communication, electronic circuit, material science, medical equipment, inspection and testing, precision parts processing and research institutes. We have a profound product portfolio including but not limited to ultra-depth of field microscope, metallographic microscope, measuring microscope&machines, scanning electron microscope, electron microscope sample preparation equipment, confocal microscope, wafer loader and other high-end optical testing equipment.
Exhibit brands
Exhibits
Automatic Materials Research Microscope
The Leica DM6 M enables the most accurate and reproducible optical inspection system for fully automated material analysis by laboratory researchers and quality inspectors.
Measuring microscope
The tool microscope is equipped with a precision grating ruler and a high-resolution optical lens, which is widely used for product size measurement and surface defect observation with micron accuracy requirements.
Super depth of field microscope DVM6
The DVM6 Ultra Depth of Field Microscope is equipped with Leica's leading optical system and big bore 16:1 large zoom APO optical lens, which makes it easy and fast to switch from macro to micro observation. The integrated 10 million physical pixel high-definition camera system shows the details of the product.
Confocal microscope
The Rtec UP series profilers offer non-contact surface measurements from the nanometer to the micrometer scale, combining five imaging modes to characterize all types of surfaces in one measurement system. One click automatically switches between different imaging modes.
Main products
High-end Optical Inspection&Measurement Equipment and software,including Ultra-depth of field microscope, Metallographic Microscope, Measuring microscope and machine, Sanning Electron Microscope, Ion Beam Cutting&Polishing Machines(for preparing samples of SEM/TEM), Confocal Microscope, Wafer Loader,etc.
