Xi'an Weierxin Precision Instrument Co., Ltd.

Company Introduce

Xi'an WILSON Precision Instrument Co., Ltd. (WILSON), founded in 1999, specializes in the R & D, production, sales and service of cylindricity instrument, roundness instrument, profilometer, roughness profilometer, piston profile measuring instrument, camshaft/crankshaft measuring instrument, ultra-precision goniometer and its measurement software; Based on the precision manufacturing industry for 20 years, the company has served thousands of enterprises, and has always insisted on high-quality products and services to help you manufacture precision. The R & D center of Xi'an Weierxin Precision Co., Ltd. is set up in Xi'an, and there are permanent offices in Guangzhou, Zhejiang, Jiangsu, Chongqing, Shandong, Hunan and other places to provide fast and high-quality services for customers and distributors. The company has passed ISO9001: 2008 international quality management system certification; exported to the European Union CE certification; and obtained "high-tech enterprise" and "software enterprise" recognition. All products are independently developed and produced by the company and have independent intellectual property rights, with 37 patents of various types. As an expert in the production of air bearings and air guide rails, our company has rich manufacturing experience, and has provided the market with a series of roundness and cylindricity instruments ranging from 15 Kg to 1000 Kg; our company even has the production capacity of manufacturing air bearings with a bearing weight of up to 1.5 tons, which can meet the special customization needs of users. The company is led by a team of senior experts with decades of experience in research and development of precision instruments, relying on universities and research institutes in Xi'an, with the advantages of high quality, short delivery time, fast service and high cost performance.

Cylindricity meter

Using the radius measurement method with the workpiece rotating, the system can measure and analyze functions such as cylindricity, roundness, straightness, coaxiality, concentricity, face run-out, total face run-out, perpendicularity, parallelism, and flatness. It can also analyze surface waviness, spectral analysis, wave height analysis, adjacent disc run-out, and inter-disc step differences.

Roughness profilometer

Translation: This instrument employs the Cartesian coordinate measurement method with a stylus contact approach. It can measure the following dimensions, angles, tolerances, and generate auxiliary elements, as well as perform roughness and waviness analysis: Dimensions: Horizontal distance Vertical distance Linear distance Radius Diameter Angles: Horizontal angle Vertical angle Included angle Positional Tolerances: Parallelism Perpendicularity Form Tolerances: Straightness Flatness Circular profile Auxiliary Generation: Auxiliary points Auxiliary lines Auxiliary circles Roughness Analysis: Arithmetic mean height (Ra) Root mean square height (Rq) Maximum height of the profile (Rz) Peak height (Rp) Total height of the profile (Rt) Skewness (Rsk) Mean spacing of the profile elements (Rsm) Core roughness depth (Rc) Rz (DIN standard) R3z Rz (JIS standard) Maximum peak height (Rpmax) Maximum profile peak height (Rpm) Kurtosis (Rku) Root mean square height of the profile (Rdq/RΔq) Maximum profile valley depth (RδC) Material ratio at a specified section (Mr1, Mr2) Core roughness depth (Rpk) Valley depth of the core roughness (Rvk) Core roughness depth (Rk) Reduced peak height (Rdc) Amplitude parameters (A1, A2) Maximum profile height (Rx) Maximum profile height (AR) Core roughness depth (Rpc) Maximum roughness depth (Rmax) Rz (ISO standard) Profile height (4um) Maximum profile height (Ry) Waviness Analysis: Total waviness height (Wt) Arithmetic mean waviness height (Wa) Maximum waviness peak height (Wp) Maximum waviness valley depth (Wv) Root mean square waviness height (Wq) Core waviness depth (Wc) Kurtosis (Wku) Skewness (Wsk) Maximum waviness height (W) Maximum waviness height (Wx) Maximum waviness height (Wz) Mean spacing of the waviness profile elements (Wsm) Reduced peak height (Wdc) Total waviness height (Wte) Material ratio at a specified section (Wmr) Amplitude parameter (Aw) Material ratio curve (C(Wmr)) Material ratio at a specified section (Wmr(C)) Root mean square waviness height (Wdq/WΔq) Primary Profile Analysis: Total profile height (Pt) Arithmetic mean profile height (Pa) Maximum profile peak height (Pp) Maximum profile valley depth (Pv) Root mean square profile height (Pq) Core profile depth (Pc) Kurtosis (Pku) Skewness (Psk) Root mean square profile height (Pdq/PΔq) Mean spacing of the profile elements (Psm) Reduced peak height (Pdc) Material ratio at a specified section (Pmr(c)) Maximum profile height (Pz) Material ratio at a specified section (Pmr) Material ratio curve (C(pmr))